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Semi-grade UPE Pleated Filter

Semi-grade UPE Pleated Filter

Product ID: semi-grade-upe-cartridge-filter|Semi-grade UPE

Flagship UPE filter element specially designed for semiconductor yellow light lithography process (SEMI-Photo). Constructed with hydrophobic ultra-high molecular weight polyethylene (UPE) filter membrane, providing a wide range of precision from 2nm to 0.2µm. It has extremely low metal and organic precipitates and can effectively intercept soft colloids (Gels) and particles in photoresist liquid to ensure the yield of advanced processes.

  • Hydrophobic ultra-high molecular weight polyethylene (UPE) membrane
  • 2nm to 0.2µm broad retention covering varied process needs
  • Ultra-low metal extractables protecting process purity
  • Ultra-low organic extractables reducing organic contamination
  • Effectively captures soft gels and particles in photoresist
  • Flagship-grade design to secure advanced-node yield
Micron rating
2 nm – 0.2 µm
Max operating temperature
40 °C
Effective filtration area
Ø68 mm: 1.2 m²/10"
Nominal lengths
4" / 10" / 20"
Semiconductor photolithography (SEMI-Photo) processes
Photoresist filtration
Soft gel retention
Advanced-node particle control
High-purity solvent filtration
Filter media / membrane
Hydrophobic UPE (ultra-high molecular weight polyethylene) microporous membrane with good intrinsic cleanliness and low particle shedding, spanning 2 nm to 0.2 µm
Support & drainage layers
HDPE support & drainage layers
Cage, core & end caps
HDPE cage, core and end caps
Seals / O-rings
EPDM or TEV (modified EPDM) O-rings, 222 style
Micron rating
2 nm / 5 nm / 10 nm / 20 nm / 30 nm / 50 nm / 0.1 µm / 0.2 µm
Effective filtration area
Ø68 mm: 1.2 m²/10"; Ø83 mm: 1.8 m²/10"
Nominal outer diameter
Ø68 mm / Ø83 mm
Nominal lengths
4" / 10" / 20"
End cap / connection
222 flat, single open end
Max operating temperature
40 °C
Max forward differential pressure
0.34 MPa (49 psi) @ 25 °C
Max reverse differential pressure
0.24 MPa (34 psi) @ 25 °C
Wetting & flushing
Hydrophobic membrane supplied dry or UPW pre-wet; for photoresist and solvent duty, displace the wetting fluid stepwise with the process solvent so no interface residue is left to cause defects
Extractables & cleanliness
Metal cleanliness selectable at < 3 / < 25 µg/device; both metal and organic extractables are low
Integrity test
100% integrity tested before shipment
Packaging
Dry packed; UPW pre-wet packed
CodeOuter diameterMembrane area (10")
SXØ68 mm1.2 m²
MXØ83 mm1.8 m²

Note: actual compatibility and service life depend on chemical concentration, temperature, flow, differential pressure, upstream contamination load and housing design. Validate under your real process conditions.

Example part number
JY
-WE51
-68
-R05
-10
-V3W
JY
JIUNYUAN Technology
WE51
Hydrophobic UPE microporous membrane on HDPE hardware — good intrinsic cleanliness, low shedding
68
Ø68 mm
R05
5 nm
10
10"
V3W
TEV O-ring | grade 3 (< 3 µg/device) | UPW pre-wet
Selectable options by segment
01

Outer diameter

CodeSpecification
68Ø68 mm
83Ø83 mm
02

Retention rating

CodeSpecification
R022 nm
R055 nm
R1010 nm
R2020 nm
R3030 nm
R5050 nm
P100.1 µm
P200.2 µm

R02 and R05 consume the whole ΔP budget below 1 GPM, so in practice they run at low flow with cartridges in parallel.

03

Length

CodeSpecification
044"
1010"
2020"
04

O-ring material

CodeSpecification
EEPDM
VTEV (modified EPDM)
05

Cleanliness grade

CodeSpecification
3< 3 µg/device
5< 25 µg/device

The catalogue offers < 3 and < 25 µg/device (codes 3 and 5).

06

Packaging

CodeSpecification
DDry packed
WUPW pre-wet packed

For photoresist and solvent duty, displace the wetting fluid stepwise with the process solvent so no interface residue is left to cause defects.

Not every combination is a stock item; uncommon combinations are made to order. Confirm with JIUNYUAN sales before ordering.

Single open end, 222 flat
Single open end, 222 flatDrawing shows one representative size; the table below gives the exact diameter and length of each code.
Diameter / nominal lengthABC
Ø68 mm 4"131.5 ± 2 mm117.0 ± 2 mm115.0 ± 2 mm
Ø68 mm 10"249.5 ± 2 mm235.0 ± 2 mm233.0 ± 2 mm
Ø68 mm 20"488.5 ± 2 mm474.0 ± 2 mm472.0 ± 2 mm
Ø83 mm 4"118.0 ± 2 mm103.0 ± 2 mm101.0 ± 2 mm
Ø83 mm 10"238.0 ± 2 mm223.0 ± 2 mm221.0 ± 2 mm
Ø83 mm 20"460.0 ± 2 mm445.0 ± 2 mm443.0 ± 2 mm

A = overall length; B = seal face to seal face; C = effective media length.

2 nm5 nm10 nm20 nm30 nm50 nm00.250.500.751.00GPM01.002.003.00LPM010.020.030.040.0kPa02.004.00psi

UPW at 25 °C, single Ø68 mm 10" cartridge (1.2 m²), clean initial ΔP Right axis shows the same values in psi.

The axis stops at 1 GPM: at 2 nm and 5 nm the whole ΔP budget is spent inside that range, so these ratings run at low flow with cartridges in parallel. For photoresist and solvents, scale ΔP by the fluid viscosity ratio.

View data table
GPM / LPM2 nm5 nm10 nm20 nm30 nm50 nm
0.25 / 0.957.575.943.521.981.510.84
0.50 / 1.8915.111.97.043.963.031.68
0.75 / 2.8422.717.810.65.954.542.52
1.00 / 3.7930.323.814.17.936.053.36
ChemicalPTFEPP
— 酸 —
Glacial acetic acidRR
Hydrochloric acid, conc.RR
Hydrochloric acid, 6NRR
Nitric acid, conc.RR
Nitric acid, 6NRR
Phosphoric acid, conc.RR
Sulfuric acid, conc.RR
Hydrofluoric acid, 6NRNR
— 鹼 —
Ammonium hydroxide, 1NRR
Ammonium hydroxide, 3NRR
Potassium hydroxide, 3NRR
Sodium hydroxide, 3NRR
Sodium hydroxide, 6NRR
— 醇類 —
Amyl alcoholRR
Benzyl alcoholRR
ButanolRR
Isopropyl alcohol (IPA)RR
MethanolRR
— 酮類 —
AcetoneRR
CyclohexanoneRR
Methyl ethyl ketone (MEK)RR
Methyl isobutyl ketone (MIBK)RR
— 油類 —
Cottonseed oilRR
Lubricating oilRR
Peanut oilRR
Sesame oilRR
— 芳香烴 —
BenzeneRNR
TolueneRNR
XyleneRNR
— 鹵代烴 —
Carbon tetrachlorideRLR
ChloroformRLR
Ethylene dichlorideRLR
Freon TFRLR
Freon TMCRLR
DichloromethaneRLR
PerchloroethyleneRLR
TrichloroethyleneRLR
— 二醇類 —
Ethylene glycolRR
GlycerolRR
Propylene glycolRR
— 醚類 —
Diethyl etherRLR
Isopropyl etherRR
DioxaneRR
Tetrahydrofuran (THF)RLR
— 酯類 —
Amyl acetateRR
Butyl acetateRLR
Cellosolve acetateRR
Ethyl acetateRLR
Methyl acetateRR
Isopropyl acetateRR
— 其他 —
AnilineRLR
Dimethylformamide (DMF)RR
Formaldehyde, 37%RR
GasolineLRLR
Hexane (anhydrous)LRLR
KeroseneRR
PhenolRR
PyridineRLR
WaterRR
AcetonitrileRLR
  • R = resistant
  • LR = limited resistance, validate on site
  • NR = not resistant
  • — = no data

Ratings are general material-level guidance, not guarantees. Actual concentration, temperature, exposure time and mechanical stress all affect the outcome — validate with samples under your real process conditions before adoption.

Where it fits

This is the flagship element on the lithography chemical side, aimed specifically at soft gels in photoresist. Gels deform: a hard particle stopped by a pore is stopped for good, but a gel can extrude through under differential pressure. Capturing them depends not only on pore size but on the membrane staying chemically stable in the chemistry — no swelling, no shedding.

Key characteristics

UPE (ultra-high molecular weight polyethylene) has good intrinsic cleanliness and low particle shedding, which matters most at ratings like 2 nm: debris shed by the filter itself is the same size as what it is meant to capture. Metal and organic extractables are both low, with metal cleanliness selectable at < 3 or < 25 µg/device.

Ratings run from 2 nm all the way to 0.2 µm, so one family covers the most demanding advanced-node duty through to general filtration without changing housing or end cap interface.

Choosing between options

Against the other lithography workhorse, the Nylon 66 cartridge:

ItemUPE (this)Nylon 66
MembraneUPE, hydrophobicNylon 66, naturally hydrophilic
Rating2 nm – 0.2 µm2 nm – 0.1 µm
Diameter / areaØ68 1.2 m2 / Ø83 1.8 m2 per 10"Ø68 mm, 0.7 or 1.3 m2 per 10"
Choose it whenGel capture in resist, more area and wider rating rangeAqueous or polar chemistry, alcohol-free start-up

Operation & change-out

The membrane is hydrophobic and ships dry or ultrapure-water pre-wet. For photoresist and solvent duty, displace the wetting fluid stepwise with the process solvent — an interface left between wetting fluid and process fluid at the membrane face shows up directly as a coating defect. Maximum forward ΔP is 0.34 MPa and reverse 0.24 MPa, ceiling 40 °C.

At 2 nm and 5 nm the entire usable ΔP budget is spent inside the 0 to 1 GPM range, so these ratings run at low flow with cartridges in parallel. For photoresist and solvents, scale the pressure drop by the fluid viscosity ratio against water rather than reading the water curve directly.
UPE or Nylon 66 for resist?
Both are built for the photo process. UPE is hydrophobic UHMWPE with ultra-low metal and organic leaching, excelling at capturing soft gels and particles in photoresist; Nylon 66 is naturally hydrophilic. Select by your resist's wetting behavior and target defect type.
Why emphasize soft gel retention?
Soft gels and particles in photoresist are leading causes of pattern defects and yield loss at advanced nodes. The UPE membrane effectively captures these hard-to-remove soft gels and, with retention from 2nm, directly improves lithography quality and wafer yield.
How broad is the UPE range?
It offers a broad 2nm to 0.2µm range, covering the most demanding advanced-node needs through to general high-purity solvent filtration. Let our team help select the optimal rating by target particle size, resist viscosity and flow requirements.